UOJ Online catalog › ISBD view

Normal view MARC view ISBD view

Aliev, Telman

Digital noise monitoring of defect origin - New York Speinger 2007 - xii, 223 p.

ISBN: 9780387717531

Subjects--Topical Terms:
Signal detection

Dewey Class. No.: 621.38224 / ALI

Print
Add to your cart (remove)
Save record
More searches