| 000 -LEADER |
|---|
| fixed length control field |
00673nam a2200229Ia 4500 |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20220121142506.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
180712s9999 xx 000 0 und d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
471241393 |
| 041 ## - LANGUAGE |
|---|
| Language of text/sound track |
English |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.38152 |
| Author Mark |
SCH |
| DDC Edition number |
23 |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Schroder,Dieter K. |
| 245 ## - TITLE STATEMENT |
|---|
| Title |
Semiconductor material and device characterization / |
| Statement of responsibility, etc. |
[by] Dieter K.Schroder |
| 250 ## - EDITION STATEMENT |
|---|
| Edition statement |
2nd ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
New York |
| Name of publisher, distributor, etc. |
John-Wiley & Sons |
| Date of publication, distribution, etc. |
1998 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xxiv, 760 p.- |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
A Wiley-Interscience publication |
| 500 ## - GENERAL NOTE |
|---|
| General note |
Includes appendixes, references and index. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Semiconductors |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Semiconductors-Testing |
| 9 (RLIN) |
103119 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| item type |
Books in Reference (R) |
