Field ion microscopy: principles and applications / (Record no. 63799)

000 -LEADER
fixed length control field 00477nam a2200157Ia 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220214102852.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 180710s9999 xx 000 0 und d
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 537.56
Author Mark MUL
DDC Edition number 23
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name MULLER, Erwin W.
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Tsong, Tien Tzou
245 ## - TITLE STATEMENT
Title Field ion microscopy: principles and applications /
Statement of responsibility, etc. [by] Erwin W.Muller, Tien Tzou Tsong
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. New York
Name of publisher, distributor, etc. American Elsevier pub.
Date of publication, distribution, etc. 1969
300 ## - PHYSICAL DESCRIPTION
Extent v, 314 p.
500 ## - GENERAL NOTE
General note Includes index.
942 ## - ADDED ENTRY ELEMENTS (KOHA)
item type Books in Stacks (S)
Holdings
Withdrawn status Lost status Damaged status Not for loan Permanent Location Current Location Shelving location Date acquired Price Full call number Accession Number Date last seen item type
        Main Library Main Library Science & Technology 2018-07-13 0.00 537.56 MUL 55476 2018-07-13 Books in Stacks (S)
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