| 000 -LEADER |
|---|
| fixed length control field |
00400nam a2200145Ia 4500 |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20230601155928.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
180710s9999 xx 000 0 und d |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
669.9 |
| Author Mark |
TOL |
| DDC Edition number |
23 |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
TOLANSKY, S. |
| 245 ## - TITLE STATEMENT |
|---|
| Title |
Multiple-beam interference microscopy of metals |
| Statement of responsibility, etc. |
/[by]S.Tolansky |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
London |
| Name of publisher, distributor, etc. |
Academic press |
| Date of publication, distribution, etc. |
1970 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
ix, 146 p. |
| 500 ## - GENERAL NOTE |
|---|
| General note |
Includes index. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| item type |
Books in Stacks (S) |
