Semiconductors testing and adjusting (Record no. 78280)

000 -LEADER
fixed length control field 00558nam a2200205Ia 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20200727120424.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 180710s9999 xx 000 0 und d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 30991
041 ## - LANGUAGE
Language of text/sound track English
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Author Mark GRE
DDC Edition number 23
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name GREEN, G.
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Shokalsky, A.
245 ## - TITLE STATEMENT
Title Semiconductors testing and adjusting
Statement of responsibility, etc. / [by] G. Green and A. Shokalsky; translated by George Roberts
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Moscow
Name of publisher, distributor, etc. MIR pub.
Date of publication, distribution, etc. 1972
300 ## - PHYSICAL DESCRIPTION
Extent 204 p.
500 ## - GENERAL NOTE
General note Includes index.
700 ## - ADDED ENTRY--PERSONAL NAME
9 (RLIN) 103000
Personal name Roberts, George.
942 ## - ADDED ENTRY ELEMENTS (KOHA)
item type Books in Reference (R)
Holdings
Withdrawn status Lost status Damaged status Not for loan Permanent Location Current Location Shelving location Date acquired Price Full call number Accession Number Date last seen item type Source of acquisition
        Engineering Library Engineering Library Science & Technology 2018-07-16 0.00 621.3815 GRE 30992 2018-07-16 Books in Reference (R) Not Known
        Main Library Main Library Science & Technology 2018-07-14 0.00 621.3815 GRE 30991 2018-07-14 Books in Stacks (S)  
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