Spatially resolved characterization of local phenomena in materials and nanostru / edited Javier Piqueras...[et al.],
By: Symposium proceedings on spatially resolved characterization.
Contributor(s): Javier Piqueras
| Fredy R. Zypman | Dawn A. Bonnell | Andrew P. Shreve.
Publisher: Warrendale Materials Research Society 2003Edition: 22nd ed.Description: 422 p.Subject(s): NanotechnologyDDC classification: 620.5
| Item type | Current location | Collection | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
Books in Stacks (S)
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Engineering Library Science & Technology | S | 620.5 SYM (Browse shelf) | Available | 256755 |
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