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_c186644 _d186643 |
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| 005 | 20250211095339.0 | ||
| 006 | m |o d | | ||
| 007 | cr ||||||||||| | ||
| 008 | 180727s2019 flu ob 001 0 eng | ||
| 010 | _a 2020692534 | ||
| 020 |
_a9780429589867 _qebook |
||
| 020 | _a9780429196492(ebook) | ||
| 020 |
_z9781498783613 _qhardback : alk. paper |
||
| 040 | _beng | ||
| 050 | 0 | 0 | _aTA417.25 |
| 082 | 0 | 0 |
_a620.11272 _223 _bGRE |
| 100 | 1 |
_aGreenberg, Joel _q(Joel Alter) |
|
| 245 | 1 | 0 |
_aX-ray diffraction imaging : _btechnology and applications / _cedited by Joel Greenberg, managing editor, Krzysztof Iniewski. |
| 264 | 1 |
_aBoca Raton : _bCRC Press, _c[2019] |
|
| 300 | _a1 online resource. | ||
| 490 | 0 | _aDevices, circuits, and systems | |
| 504 | _aIncludes bibliographical references and index. | ||
| 588 | _aDescription based on print version record. | ||
| 650 | 0 | _aX-ray diffraction imaging. | |
| 650 | 0 | _aRadiography, Industrial. | |
| 650 | 0 |
_aDetectors _xEquipment and supplies. |
|
| 650 | 0 | _aRefractometers. | |
| 700 | 1 |
_aIniewski, Krzysztof, _d1960- |
|
| 776 | 0 | 8 |
_iPrint version: _tX-ray diffraction imaging _dBoca Raton : Taylor & Francis, CRC Press, 2018. _z9781498783613 (hardback : alk. paper) _w(DLC) 2018027858 |
| 856 |
_3EB _uhttps://doi.org/10.1201/9780429196492 _ySF |
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| 906 |
_a7 _bcbc _corigcop _d1 _eecip _f20 _gy-gencatlg |
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| 942 | _cEB | ||