000 00537nam a2200181Ia 4500
999 _c56220
_d56220
005 20230802120429.0
008 180710s9999 xx 000 0 und d
020 _a136412
041 _aEN
082 _a621.3815
_bROB
_223
100 _aRobrts, Gordon W
100 _aK. Lu, Albert
245 _aAnalog signal generation for built in self test of mixed signal integrated circuits
_c/ by Gordon W. Robrts, Albert K. Lu
260 _aBoston
_bKluwer academic
_c1995
300 _aviii, 122 p.
500 _aIncludes index
942 _cS