| 000 | 00738nam a2200229Ia 4500 | ||
|---|---|---|---|
| 999 |
_c79385 _d79385 |
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| 005 | 20210107131727.0 | ||
| 008 | 180710s9999 xx 000 0 und d | ||
| 041 | _aEN | ||
| 082 |
_a620.5 _bSYM _223 |
||
| 100 | _aSymposium proceedings on spatially resolved characterization | ||
| 245 |
_aSpatially resolved characterization of local phenomena in materials and nanostru _c/ edited Javier Piqueras...[et al.], |
||
| 250 | _a22nd ed. | ||
| 260 |
_aWarrendale _bMaterials Research Society _c2003 |
||
| 300 | _a422 p. | ||
| 509 | _aNS | ||
| 650 | _aNanotechnology | ||
| 700 |
_9101879 _a Javier Piqueras |
||
| 700 |
_9101880 _aFredy R. Zypman |
||
| 700 |
_9101882 _aDawn A. Bonnell |
||
| 700 |
_9101884 _aAndrew P. Shreve |
||
| 942 | _cS | ||