Semiconductors testing and adjusting / [by] G. Green and A. Shokalsky; translated by George Roberts
By: GREEN, G | Shokalsky, A.
Contributor(s): Roberts, George.
Publisher: Moscow MIR pub. 1972Description: 204 p.ISBN: 30991.DDC classification: 621.3815Item type | Current location | Collection | Call number | Status | Notes | Date due | Barcode |
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Books in Reference (R) | Engineering Library Science & Technology | R | 621.3815 GRE (Browse shelf) | Available | ENG | 30992 | |
Books in Stacks (S) | Main Library Science & Technology | S | 621.3815 GRE (Browse shelf) | Available | 30991 |
Browsing Main Library Shelves , Shelving location: Science & Technology , Collection code: S Close shelf browser
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621.3815 BOY Essentials of Circuit Analysis | 621.3815 CAR Microelectronic circuits and applications / | 621.3815 CEN Central:semiconductoe corp | 621.3815 GRE Semiconductors testing and adjusting | 621.3815 MAL Transistor circuit approximations / | 621.3815 MUL Multistage transistor circuits | 621.3815 REL RELAY production electrician |
Includes index.
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